cie

17-25-114

sampling aperture

area of the reference plane on which measurements are made

Note 1 to entry: The sampling aperture is delimited by the area illuminated, or by the area over which the receiver senses flux, whichever is smaller. If the illuminated area is the larger, the area measured is said to be "overfilled"; if it is the smaller, the area measured is said to be "underfilled".

Note 2 to entry: This entry was numbered 17-1135 in CIE S 017:2011.

Publication date: 2020-12
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