cie

17-25-110

reference plane, <in photometric or radiometric measurements>

plane in which the surface of a sample or standard is placed during measurements

Note 1 to entry: For reflection measurements, the geometry is defined with respect to the reference plane. For transmission measurements, there is a reference plane for the incident light and a second reference plane, displaced by the sample thickness, for the transmitted light.

Note 2 to entry: This entry was numbered 17-1055 in CIE S 017:2011.

Publication date: 2020-12
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