Update on CIE Symposium and Associated Events in Hong Kong, April 2020
As decisions are being made for this event the early registration deadline has been extended to March 13, 2020
A survey has been created to help us in the planning for this event. We kindly ask you to complete this survey in the coming days but no later than Friday, February 28, 2020.
We are all aware of the novel coronavirus situation in China which is impacting upon Hong Kong and other regions. This brings a layer of difficulty in confidently holding the event in Hong Kong.
It is likely that the novel coronavirus situation will be managed by April, however it is well understood that now is the time all are preparing to travel to the event and are reconsidering to travel to Hong Kong.
In spite of this unpleasant situation we are making the effort to ensure that this CIE event takes place. Our local hosts and others are working together to make available alternate ways to participate, including attending the various parts of this event online (both oral and poster presentations) and/or possible postponement of the event to some other date. As written above, a survey has been created to help us in planning this CIE event and your participation in this survey would be of great help to us.
We still look forward to your participation, your presentation(s) and discussions at this CIE event, whether in person (in April or at a later date) or online. And lastly, we appreciate your patience and understanding about the difficulties associated with the organization of this event.
This 5 day event comprises a two day symposium, a day of workshops, plus the annual meetings of CIE Divisions 1, 2 and 8, and their Technical Committees.
Like its predecessors the symposium will be of interest to those concerned with aspects of the perception and measurement of visual appearance and measurement of the bidirectional reflection and transmission distribution functions of modern materials.
There will be ample social time to experience the local culture. As such, it forms a great opportunity to bring together international members of the CIE, as well as other experts and stakeholders in the fields of vision and colour, measurement and image technology.
Links to the information points listed below will be added as they are made available:
- Letter of Invitation
- Draft Programme Tutorial/Workshops
- Draft Programme Symposium - NEW: Detailed programme as of 2020-01-10 (still subject to change)
- For presenters: Author Instructions and Guidelines for Oral Presentations
- Registration Open
Early Deadline extended to March 13, 2020
Standard Deadline April 6, 2020
Onsite registration will be available - cash only in HK$
- Hotel Suggestions
Note that blocks of rooms have been set aside for participants at the Icon Hotel (symposium venue) and the Harbour Plaza Metropolis Hotel.
- General Information - including event locations
- Travel Information
- ISC and LOC contributors
- Sponsorship Opportunities
Sponsor and make this symposium a great event to share information and network, while at the same time promoting your company or organization.
Thanks to the following sponsors:
Scope of the Symposium
Assessing the visual appearance of objects and materials is a very complicated process for which four research areas have been suggested: colour, gloss, texture and translucency. This CIE Expert Symposium aims to create a symbiosis between the different scientific disciplines conducting research about visual appearance and related attributes, comprising the fields of vision, metrology, and image technology.
The following topics, related to visual appearance, colour, gloss, translucency, and texture, are key to the symposium, with possibility to submit abstracts on other related topics:
- Limitations of physical colour measurements
- 3D Printing Appearance
- Augmented / Virtual Reality as a tool for studying Visual Appearance
- Appearance Metrology as a tool for better Augmented / Virtual Reality applications
- Perception in High-Dynamic Range or Wide Colour Gamut Imaging
- Image vs. non-image based appearance measurement
- Appearance Applications and Phenomena